{"id":8644,"date":"2026-02-06T14:05:51","date_gmt":"2026-02-06T06:05:51","guid":{"rendered":"https:\/\/www.sic-wafers.com\/?p=8644"},"modified":"2026-02-06T14:05:55","modified_gmt":"2026-02-06T06:05:55","slug":"high-temperature-dic-sapphire-vs-quartz-as-window-materials","status":"publish","type":"post","link":"https:\/\/www.sic-wafers.com\/cs\/high-temperature-dic-sapphire-vs-quartz-as-window-materials\/","title":{"rendered":"Vysokoteplotn\u00ed DIC: saf\u00edr vs. k\u0159emen jako okenn\u00ed materi\u00e1ly"},"content":{"rendered":"<div style=\"margin-top: 0px; margin-bottom: 0px;\" class=\"sharethis-inline-share-buttons\" ><\/div>\n<p>Digit\u00e1ln\u00ed obrazov\u00e1 korelace (DIC) se stala nepostradateln\u00fdm n\u00e1strojem pro bezkontaktn\u00ed m\u011b\u0159en\u00ed deformace a nap\u011bt\u00ed ve v\u00fdzkumu materi\u00e1l\u016f. P\u0159i vysokoteplotn\u00edch aplikac\u00edch je rozhoduj\u00edc\u00ed v\u00fdb\u011br vhodn\u00e9ho materi\u00e1lu okna, proto\u017ee p\u0159\u00edmo ovliv\u0148uje optickou \u010distotu, tepelnou stabilitu a p\u0159esnost experimentu. Dv\u011bma b\u011b\u017en\u00fdmi volbami pro vysokoteplotn\u00ed okna jsou saf\u00edr (monokrystal Al\u2082O\u2083) a k\u0159emen (SiO\u2082), p\u0159i\u010dem\u017e ka\u017ed\u00fd z nich m\u00e1 odli\u0161n\u00e9 v\u00fdhody a omezen\u00ed.<\/p>\n\n\n\n<figure class=\"wp-block-image aligncenter size-full\"><img data-dominant-color=\"bbcbdc\" data-has-transparency=\"false\" style=\"--dominant-color: #bbcbdc;\" fetchpriority=\"high\" decoding=\"async\" width=\"600\" height=\"600\" src=\"https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp\" alt=\"\" class=\"wp-image-8013 not-transparent\" srcset=\"https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp 600w, https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1-300x300.webp 300w, https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1-150x150.webp 150w, https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1-100x100.webp 100w\" sizes=\"(max-width: 600px) 100vw, 600px\" \/><\/figure>\n\n\n\n<h4 class=\"wp-block-heading\">1. Tepeln\u00e1 stabilita<\/h4>\n\n\n\n<p>Vysokoteplotn\u00ed experimenty s DIC \u010dasto p\u0159esahuj\u00ed 600-1000 \u00b0C, co\u017e klade zna\u010dn\u00e9 tepeln\u00e9 n\u00e1roky na materi\u00e1l okna.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Saf\u00edr:<\/strong> Vykazuje extr\u00e9mn\u011b vysok\u00fd bod t\u00e1n\u00ed (~2030 \u00b0C) a vynikaj\u00edc\u00ed odolnost proti teplotn\u00edm \u0161ok\u016fm. Jeho tepeln\u00e1 vodivost (~35 W\/m-K p\u0159i pokojov\u00e9 teplot\u011b) je vy\u0161\u0161\u00ed ne\u017e u k\u0159emene, co\u017e umo\u017e\u0148uje rychl\u00fd odvod tepla a sn\u00ed\u017een\u00ed lok\u00e1ln\u00edch tepeln\u00fdch gradient\u016f, kter\u00e9 by mohly zkreslit optick\u00e1 m\u011b\u0159en\u00ed.<\/li>\n\n\n\n<li><strong>K\u0159emen:<\/strong> Taven\u00fd oxid k\u0159emi\u010dit\u00fd m\u00e1 ni\u017e\u0161\u00ed bod m\u011bknut\u00ed (~1600 \u00b0C) a hor\u0161\u00ed tepelnou vodivost (~1,4 W\/m-K). K\u0159emenn\u00e1 okna jsou sice vhodn\u00e1 pro st\u0159edn\u011b vysokoteplotn\u00ed experimenty, ale p\u0159i rychl\u00fdch teplotn\u00edch zm\u011bn\u00e1ch v nich mohou vznikat mikrotrhliny nebo deformace, co\u017e m\u016f\u017ee ohrozit p\u0159esnost DIC.<\/li>\n<\/ul>\n\n\n\n<h4 class=\"wp-block-heading\">2. Mechanick\u00e1 pevnost a odolnost<\/h4>\n\n\n\n<p>Materi\u00e1ly oken mus\u00ed odol\u00e1vat mechanick\u00e9mu nam\u00e1h\u00e1n\u00ed od upev\u0148ovac\u00edch prvk\u016f, tepeln\u00e9 rozta\u017enosti a p\u0159\u00edle\u017eitostn\u00e9mu kontaktu.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Saf\u00edr:<\/strong> M\u00e1 tvrdost podle Mohse 9, tak\u017ee je extr\u00e9mn\u011b odoln\u00fd proti po\u0161kr\u00e1b\u00e1n\u00ed a od\u011bru. Jeho lomov\u00e1 hou\u017eevnatost je vy\u0161\u0161\u00ed ne\u017e u k\u0159emene, co\u017e sni\u017euje riziko katastrofick\u00e9ho selh\u00e1n\u00ed v n\u00e1ro\u010dn\u00fdch podm\u00ednk\u00e1ch.<\/li>\n\n\n\n<li><strong>K\u0159emen:<\/strong> K\u0159emen je m\u011bk\u010d\u00ed (Mohs ~7) a k\u0159eh\u010d\u00ed, tak\u017ee je n\u00e1chyln\u00fd k od\u0161t\u011bpov\u00e1n\u00ed nebo prask\u00e1n\u00ed p\u0159i mechanick\u00e9m nam\u00e1h\u00e1n\u00ed, zejm\u00e9na p\u0159i vysok\u00fdch teplot\u00e1ch.<\/li>\n<\/ul>\n\n\n\n<h4 class=\"wp-block-heading\">3. Optick\u00e1 pr\u016fhlednost a p\u0159esnost m\u011b\u0159en\u00ed<\/h4>\n\n\n\n<p>DIC je zalo\u017eena na jasn\u00e9m zobrazen\u00ed p\u0159es ok\u00e9nko; jak\u00e1koli absorpce, rozptyl nebo dvojlom mohou zp\u016fsobit chyby m\u011b\u0159en\u00ed.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Saf\u00edr:<\/strong> Pr\u016fhledn\u00fd od ultrafialov\u00e9 (~200 nm) po infra\u010dervenou oblast (~5 \u00b5m) s minim\u00e1ln\u00edm optick\u00fdm zkreslen\u00edm. Jeho vysok\u00fd index lomu (n \u2248 1,76) vy\u017eaduje pe\u010dliv\u00e9 antireflexn\u00ed vrstvy pro vysoce p\u0159esn\u00e9 zobrazov\u00e1n\u00ed, ale obecn\u011b zaji\u0161\u0165uje vynikaj\u00edc\u00ed propustnost sv\u011btla.<\/li>\n\n\n\n<li><strong>K\u0159emen:<\/strong> Transparentn\u00ed od UV (~180 nm) po bl\u00edzk\u00e9 IR (~3,5 \u00b5m), s velmi n\u00edzkou vnit\u0159n\u00ed dvojlomnost\u00ed. Tepeln\u00e9 gradienty p\u0159i vysok\u00fdch teplot\u00e1ch v\u0161ak mohou vyvolat lok\u00e1ln\u00ed zm\u011bny indexu lomu, co\u017e m\u00edrn\u011b sni\u017euje v\u011brnost m\u011b\u0159en\u00ed ve srovn\u00e1n\u00ed se saf\u00edrem.<\/li>\n<\/ul>\n\n\n\n<h4 class=\"wp-block-heading\">4. Chemick\u00e1 odolnost<\/h4>\n\n\n\n<p>Experimenty p\u0159i vysok\u00fdch teplot\u00e1ch mohou zahrnovat reaktivn\u00ed atmosf\u00e9ry, jako je kysl\u00edk, argon nebo dokonce roztaven\u00e9 soli.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Saf\u00edr:<\/strong> Chemicky inertn\u00ed a odoln\u00fd v\u016f\u010di oxidaci, kyselin\u00e1m a v\u011bt\u0161in\u011b reaktivn\u00edch plyn\u016f p\u0159i zv\u00fd\u0161en\u00fdch teplot\u00e1ch.<\/li>\n\n\n\n<li><strong>K\u0159emen:<\/strong> Obecn\u011b chemicky stabiln\u00ed, ale m\u00e9n\u011b odoln\u00e9 v\u016f\u010di n\u011bkter\u00fdm alkalick\u00fdm par\u00e1m a n\u00e1chyln\u011bj\u0161\u00ed k devitrifikaci p\u0159i dlouhodob\u011b vysok\u00fdch teplot\u00e1ch.<\/li>\n<\/ul>\n\n\n\n<h4 class=\"wp-block-heading\">5. \u00davahy o n\u00e1kladech a v\u00fdrob\u011b<\/h4>\n\n\n\n<p>V\u00fdkon je sice rozhoduj\u00edc\u00ed, ale z\u00e1le\u017e\u00ed i na praktick\u00fdch faktorech, jako je cena, dostupnost a velikost okna.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Saf\u00edr:<\/strong> Dra\u017e\u0161\u00ed a omezen\u00e1 velikost pro vysoce kvalitn\u00ed optick\u00e1 okna. V\u00fdroba a le\u0161t\u011bn\u00ed vy\u017eaduj\u00ed specializovan\u00e9 techniky.<\/li>\n\n\n\n<li><strong>K\u0159emen:<\/strong> Je cenov\u011b dostupn\u011bj\u0161\u00ed, snadn\u011bji se vyr\u00e1b\u00ed ve v\u011bt\u0161\u00edch velikostech a je \u0161iroce dostupn\u00fd, tak\u017ee je vhodn\u00fd pro m\u00e9n\u011b n\u00e1ro\u010dn\u00e9 vysokoteplotn\u00ed aplikace DIC.<\/li>\n<\/ul>\n\n\n\n<h4 class=\"wp-block-heading\">Z\u00e1v\u011br<\/h4>\n\n\n\n<p>Pro vysokoteplotn\u00ed experimenty s DIC p\u0159esahuj\u00edc\u00ed ~800 \u00b0C nebo vy\u017eaduj\u00edc\u00ed vysokou mechanickou a tepelnou odolnost, <a href=\"https:\/\/www.sic-wafers.com\/cs\/product-category\/sapphireal%e2%82%82o%e2%82%83\/safirova-okna\/\">saf\u00edrov\u00e1 okna<\/a> jsou vynikaj\u00edc\u00ed volbou d\u00edky sv\u00e9 v\u00fdjime\u010dn\u00e9 tepeln\u00e9 stabilit\u011b, mechanick\u00e9 pevnosti a optick\u00e9 \u010distot\u011b. K\u0159emen z\u016fst\u00e1v\u00e1 \u017eivotaschopnou a cenov\u011b v\u00fdhodnou volbou pro m\u00edrn\u00e9 teploty a m\u00e9n\u011b n\u00e1ro\u010dn\u00e1 experiment\u00e1ln\u00ed uspo\u0159\u00e1d\u00e1n\u00ed. V\u00fdb\u011br vhodn\u00e9ho materi\u00e1lu okna nakonec z\u00e1vis\u00ed na konkr\u00e9tn\u00edm rozsahu teplot, mechanick\u00e9m nam\u00e1h\u00e1n\u00ed, chemick\u00e9m prost\u0159ed\u00ed a rozpo\u010dtov\u00fdch omezen\u00edch aplikace DIC.<\/p>","protected":false},"excerpt":{"rendered":"<p>Digital Image Correlation (DIC) has become an indispensable tool for non-contact strain and deformation measurements in materials research. In high-temperature applications, selecting the appropriate window material is critical, as it directly impacts optical clarity, thermal stability, and experimental accuracy. Two common choices for high-temperature windows are sapphire (single-crystal Al\u2082O\u2083) and quartz (SiO\u2082), each with distinct [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":8013,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_uag_custom_page_level_css":"","footnotes":""},"categories":[12,27],"tags":[1432,1853,1848,1847,1851,1850,1849,1852,1211],"class_list":["post-8644","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news","category-companynews","tag-chemical-resistance","tag-digital-image-correlation","tag-high-temperature-dic","tag-high-temperature-measurement","tag-mechanical-strength","tag-optical-window","tag-quartz-window","tag-sapphire-window","tag-thermal-stability"],"acf":[],"uagb_featured_image_src":{"full":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp",600,600,false],"thumbnail":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1-150x150.webp",150,150,true],"medium":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1-300x300.webp",300,300,true],"medium_large":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp",600,600,false],"large":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp",600,600,false],"1536x1536":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp",600,600,false],"2048x2048":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp",600,600,false],"trp-custom-language-flag":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp",12,12,false],"woocommerce_thumbnail":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1-300x300.webp",300,300,true],"woocommerce_single":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1.webp",600,600,false],"woocommerce_gallery_thumbnail":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows-1-100x100.webp",100,100,true]},"uagb_author_info":{"display_name":"lydia","author_link":"https:\/\/www.sic-wafers.com\/cs\/author\/lydia\/"},"uagb_comment_info":2,"uagb_excerpt":"Digital Image Correlation (DIC) has become an indispensable tool for non-contact strain and deformation measurements in materials research. In high-temperature applications, selecting the appropriate window material is critical, as it directly impacts optical clarity, thermal stability, and experimental accuracy. Two common choices for high-temperature windows are sapphire (single-crystal Al\u2082O\u2083) and quartz (SiO\u2082), each with distinct&hellip;","_links":{"self":[{"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/posts\/8644","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/comments?post=8644"}],"version-history":[{"count":1,"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/posts\/8644\/revisions"}],"predecessor-version":[{"id":8645,"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/posts\/8644\/revisions\/8645"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/media\/8013"}],"wp:attachment":[{"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/media?parent=8644"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/categories?post=8644"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.sic-wafers.com\/cs\/wp-json\/wp\/v2\/tags?post=8644"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}