{"id":8617,"date":"2026-01-30T09:57:53","date_gmt":"2026-01-30T01:57:53","guid":{"rendered":"https:\/\/www.sic-wafers.com\/?p=8617"},"modified":"2026-01-30T10:02:42","modified_gmt":"2026-01-30T02:02:42","slug":"optical-grade-sapphire-substrate-properties-and-high-pressure-applications","status":"publish","type":"post","link":"https:\/\/www.sic-wafers.com\/hu\/optical-grade-sapphire-substrate-properties-and-high-pressure-applications\/","title":{"rendered":"Optikai min\u0151s\u00e9g\u0171 zaf\u00edr szubsztr\u00e1t: Szapphap: Tulajdons\u00e1gok \u00e9s nagynyom\u00e1s\u00fa alkalmaz\u00e1sok"},"content":{"rendered":"<div style=\"margin-top: 0px; margin-bottom: 0px;\" class=\"sharethis-inline-share-buttons\" ><\/div>\n<p>A zaf\u00edr (Al\u2082O\u2083) r\u00e9g\u00f3ta elismert az optikai tisztas\u00e1g, a mechanikai szil\u00e1rds\u00e1g \u00e9s a k\u00e9miai stabilit\u00e1s kiv\u00e9teles kombin\u00e1ci\u00f3ja miatt. A zaf\u00edr k\u00fcl\u00f6nb\u00f6z\u0151 form\u00e1i k\u00f6z\u00fcl, <a href=\"https:\/\/www.sic-wafers.com\/hu\/product-category\/sapphireal%e2%82%82o%e2%82%83\/sapphire-windows\/\">optikai min\u0151s\u00e9g\u0171 zaf\u00edr szubsztr\u00e1tumok<\/a> tisztas\u00e1guk, hibakontrolljuk \u00e9s egyenletes krist\u00e1lyos orient\u00e1ci\u00f3juk miatt kiemelkednek, ami n\u00e9lk\u00fcl\u00f6zhetetlenn\u00e9 teszi \u0151ket a fejlett optikai \u00e9s nagynyom\u00e1s\u00fa alkalmaz\u00e1sokban. Az \u0171rkutat\u00e1si optik\u00e1t\u00f3l a nagynyom\u00e1s\u00fa tudom\u00e1nyos k\u00eds\u00e9rletekig ezek a szubsztr\u00e1tumok megb\u00edzhat\u00f3 platformk\u00e9nt szolg\u00e1lnak, amelyek sz\u00e9ls\u0151s\u00e9ges k\u00f6r\u00fclm\u00e9nyek k\u00f6z\u00f6tt is meg\u0151rzik a szerkezeti integrit\u00e1st.<\/p>\n\n\n\n<figure class=\"wp-block-image aligncenter size-full\"><img data-dominant-color=\"b2adb8\" data-has-transparency=\"false\" style=\"--dominant-color: #b2adb8;\" fetchpriority=\"high\" decoding=\"async\" width=\"600\" height=\"600\" src=\"https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp\" alt=\"zaf\u00edr-ablakok\" class=\"wp-image-8014 not-transparent\" srcset=\"https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp 600w, https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2-300x300.webp 300w, https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2-150x150.webp 150w, https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2-100x100.webp 100w\" sizes=\"(max-width: 600px) 100vw, 600px\" \/><figcaption class=\"wp-element-caption\">zaf\u00edr-ablakok<\/figcaption><\/figure>\n\n\n\n<p><strong>Krist\u00e1lyogr\u00e1fiai \u00e9s fizikai tulajdons\u00e1gok<\/strong><br>Az optikai min\u0151s\u00e9g\u0171 zaf\u00edr szubsztr\u00e1tumok jellemz\u0151en egykrist\u00e1lyosak, hexagon\u00e1lis (trigon\u00e1lis) krist\u00e1lyszerkezettel. Ez az atomos elrendez\u0151d\u00e9s figyelemre m\u00e9lt\u00f3 kem\u00e9nys\u00e9get biztos\u00edt - a Mohs-sk\u00e1l\u00e1n 9-es \u00e9rt\u00e9kkel m\u00e9rve, ami a m\u00e1sodik a gy\u00e9m\u00e1nt ut\u00e1n -, ami hozz\u00e1j\u00e1rul a kop\u00e1s\u00e1ll\u00f3s\u00e1ghoz \u00e9s a karc\u00e1ll\u00f3s\u00e1ghoz az optikai rendszerekben. A legfontosabb fizikai tulajdons\u00e1gok a k\u00f6vetkez\u0151k:<\/p>\n\n\n\n<figure class=\"wp-block-table\"><table class=\"has-fixed-layout\"><thead><tr><th>Ingatlan<\/th><th>Tipikus \u00e9rt\u00e9k<\/th><\/tr><\/thead><tbody><tr><td>S\u0171r\u0171s\u00e9g<\/td><td>3,98 g\/cm\u00b3<\/td><\/tr><tr><td>Olvad\u00e1spont<\/td><td>2030 \u00b0C<\/td><\/tr><tr><td>H\u0151vezet\u0151 k\u00e9pess\u00e9g<\/td><td>25-46 W\/m-K (anizotr\u00f3p)<\/td><\/tr><tr><td>H\u0151t\u00e1gul\u00e1si egy\u00fctthat\u00f3<\/td><td>5-8 \u00d7 10-\u2076 \/K<\/td><\/tr><tr><td>Kem\u00e9nys\u00e9g<\/td><td>9 Mohs<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<p>A zaf\u00edr optikai \u00e1tl\u00e1tsz\u00f3s\u00e1ga sz\u00e9les spektr\u00e1lis tartom\u00e1nyt \u00f6lel fel, k\u00f6r\u00fclbel\u00fcl 150 nm-t\u0151l (ultraibolya) 5500 nm-ig (k\u00f6z\u00e9p-infrav\u00f6r\u00f6s), ami alkalmass\u00e1 teszi l\u00e1that\u00f3, UV \u00e9s IR optik\u00e1khoz. Magas t\u00f6r\u00e9smutat\u00f3ja (~1,76 590 nm-en) \u00e9s alacsony kett\u0151st\u00f6r\u00e9se pontos optikai teljes\u00edtm\u00e9nyt tesz lehet\u0151v\u00e9, k\u00fcl\u00f6n\u00f6sen a l\u00e9zerrendszerekben haszn\u00e1lt lencs\u00e9k, ablakok \u00e9s szubsztr\u00e1tumok eset\u00e9ben.<\/p>\n\n\n\n<p><strong>K\u00e9miai \u00e9s mechanikai stabilit\u00e1s<\/strong><br>A zaf\u00edr kiemelked\u0151 k\u00e9miai inertit\u00e1st mutat. Ellen\u00e1ll a savak, l\u00fagok \u00e9s a legt\u00f6bb old\u00f3szer okozta korr\u00f3zi\u00f3nak, lehet\u0151v\u00e9 t\u00e9ve a kem\u00e9ny k\u00e9miai k\u00f6rnyezetben val\u00f3 felhaszn\u00e1l\u00e1st. Mechanikai szempontb\u00f3l rendk\u00edv\u00fcli kem\u00e9nys\u00e9ge \u00e9s nagy t\u00f6r\u00e9si sz\u00edv\u00f3ss\u00e1ga (~4-6 MPa-m\u00b9\/\u00b2) lehet\u0151v\u00e9 teszi, hogy katasztrof\u00e1lis meghib\u00e1sod\u00e1s n\u00e9lk\u00fcl ellen\u00e1lljon a jelent\u0151s ig\u00e9nybev\u00e9teleknek. A k\u00e9miai \u00e9s mechanikai szil\u00e1rds\u00e1gnak ez a kombin\u00e1ci\u00f3ja kulcsfontoss\u00e1g\u00fa a nagynyom\u00e1s\u00fa k\u00eds\u00e9rletek \u00e9s ipari alkalmaz\u00e1sok szempontj\u00e1b\u00f3l.<\/p>\n\n\n\n<p><strong>Nagynyom\u00e1s\u00fa alkalmaz\u00e1sok<\/strong><br>Az optikai szubsztr\u00e1tumok egyik legig\u00e9nyesebb k\u00f6rnyezete a <strong>nagynyom\u00e1s\u00fa kutat\u00e1si \u00e9s ipari folyamatok<\/strong>. A zaf\u00edr szubsztr\u00e1tokat gyakran alkalmazz\u00e1k a:<\/p>\n\n\n\n<ol class=\"wp-block-list\">\n<li><strong>Gy\u00e9m\u00e1nt \u00fcll\u0151cell\u00e1k (DAC)<\/strong><br>A DAC-okban a zaf\u00edr ablakk\u00e9nt vagy szubsztr\u00e1tk\u00e9nt szolg\u00e1l a kis mint\u00e1k gy\u00e9m\u00e1ntcs\u00facsok k\u00f6z\u00f6tti t\u00f6m\u00f6r\u00edt\u00e9s\u00e9hez. \u00c1tl\u00e1tsz\u00f3s\u00e1ga lehet\u0151v\u00e9 teszi <strong>in-situ optikai m\u00e9r\u00e9sek<\/strong> mint p\u00e9ld\u00e1ul a spektroszk\u00f3pia, a Raman-sz\u00f3r\u00e1s \u00e9s a fluoreszcencia t\u00f6bb sz\u00e1z gigapascalt meghalad\u00f3 nyom\u00e1son. M\u00e1s anyagokkal, p\u00e9ld\u00e1ul kvarccal vagy olvasztott szil\u00edcium-dioxiddal \u00f6sszehasonl\u00edtva a zaf\u00edr meg\u0151rzi szerkezeti integrit\u00e1s\u00e1t deform\u00e1ci\u00f3 vagy a kett\u0151st\u00f6r\u00e9s okozta optikai torzul\u00e1s n\u00e9lk\u00fcl.<\/li>\n\n\n\n<li><strong>Nagynyom\u00e1s\u00fa g\u00e1z- \u00e9s vegyi kamr\u00e1k<\/strong><br>A nagynyom\u00e1s\u00fa reaktorokban vagy g\u00e1zkamr\u00e1kban l\u00e9v\u0151 zaf\u00edr ablakok a k\u00f6vetkez\u0151ket biztos\u00edtj\u00e1k <strong>a reakci\u00f3k vizu\u00e1lis megfigyel\u00e9se<\/strong> mik\u00f6zben magas nyom\u00e1st \u00e9s h\u0151m\u00e9rs\u00e9kletet kell elviselni\u00fck. K\u00e9miai inertit\u00e1sa megakad\u00e1lyozza a mar\u00f3 g\u00e1zokkal vagy folyad\u00e9kokkal val\u00f3 reakci\u00f3t, \u00edgy hossz\u00fa t\u00e1v\u00fa stabilit\u00e1st biztos\u00edt.<\/li>\n\n\n\n<li><strong>Rep\u00fcl\u0151g\u00e9p- \u00e9s v\u00e9delmi optika<\/strong><br>A rep\u00fcl\u0151g\u00e9p-\u0171rhaj\u00f3z\u00e1si \u00e9rz\u00e9kel\u0151kben \u00e9s a nagy magass\u00e1gban elhelyezett m\u0171szerekben a zaf\u00edr szubsztr\u00e1tumok nyom\u00e1sk\u00fcl\u00f6nbs\u00e9geknek vannak kit\u00e9ve a fel- \u00e9s lesz\u00e1ll\u00e1s sor\u00e1n. Az optikai min\u0151s\u00e9g\u0171 zaf\u00edr biztos\u00edtja, hogy az optikai teljes\u00edtm\u00e9nyt nem befoly\u00e1solj\u00e1k a stressz vagy a k\u00f6rnyezeti v\u00e1ltoz\u00e1sok, ugyanakkor kiv\u00e1l\u00f3 karc- \u00e9s er\u00f3zi\u00f3\u00e1ll\u00f3s\u00e1got biztos\u00edt.<\/li>\n<\/ol>\n\n\n\n<p><strong>Termikus \u00e9s optikai el\u0151ny\u00f6k nyom\u00e1s alatt<\/strong><br>A nagynyom\u00e1s\u00fa k\u00f6r\u00fclm\u00e9nyek gyakran h\u0151m\u00e9rs\u00e9klet-gradiensekkel j\u00e1rnak. A zaf\u00edr magas h\u0151vezet\u0151 k\u00e9pess\u00e9ge lehet\u0151v\u00e9 teszi, hogy <strong>gyors h\u0151elvezet\u00e9s<\/strong>, minimaliz\u00e1lva az optikai \u00fatvonalak termikus torzul\u00e1s\u00e1t. A sz\u00e9les optikai \u00e1tviteli ablak biztos\u00edtja, hogy <strong>a spektroszk\u00f3piai m\u00e9r\u00e9sek tov\u00e1bbra is pontosak maradnak<\/strong> hull\u00e1mhossz-tartom\u00e1nyban, \u00edgy ide\u00e1lis a nagy pontoss\u00e1g\u00fa k\u00eds\u00e9rletekhez.<\/p>\n\n\n\n<p><strong>Testreszab\u00e1s \u00e9s gy\u00e1rt\u00e1s<\/strong><br>Optikai min\u0151s\u00e9g\u0171 zaf\u00edr szubsztr\u00e1tumok gy\u00e1rthat\u00f3k a k\u00f6vetkez\u0151kben <strong>k\u00fcl\u00f6nb\u00f6z\u0151 orient\u00e1ci\u00f3k<\/strong> (c-s\u00edk, a-s\u00edk, m-s\u00edk) az alkalmaz\u00e1si k\u00f6vetelm\u00e9nyekt\u0151l f\u00fcgg\u0151en. Ez az orient\u00e1ci\u00f3 befoly\u00e1solja az optikai kett\u0151st\u00f6r\u00e9st \u00e9s a mechanikai viselked\u00e9st terhel\u00e9s alatt. A szubsztr\u00e1tumok pol\u00edrozhat\u00f3k <strong>nanom\u00e9teres fel\u00fcleti \u00e9rdess\u00e9g<\/strong>, ami kritikus fontoss\u00e1g\u00fa a sz\u00f3r\u00e1s minimaliz\u00e1l\u00e1s\u00e1hoz a nagy pontoss\u00e1g\u00fa optikai berendez\u00e9sekben. A tipikus vastags\u00e1gok 0,3 mm-t\u0151l n\u00e9h\u00e1ny millim\u00e9terig terjednek, m\u00edg az \u00e1tm\u00e9r\u0151 meghaladhatja a 100 mm-t ipari vagy kutat\u00e1si felhaszn\u00e1l\u00e1sra.<\/p>\n\n\n\n<p><strong>J\u00f6v\u0151beni trendek \u00e9s innov\u00e1ci\u00f3k<\/strong><br>A zaf\u00edrn\u00f6veked\u00e9s ter\u00e9n a k\u00f6zelm\u00faltban el\u00e9rt eredm\u00e9nyek, mint pl. <strong>Kyropoulos \u00e9s az \u00e9lmeghat\u00e1rozott filmes n\u00f6veked\u00e9s (EFG) m\u00f3dszerei<\/strong>, javult a krist\u00e1lyegyenletess\u00e9g \u00e9s cs\u00f6kkent a hibas\u0171r\u0171s\u00e9g, ami nagyobb \u00e9s megb\u00edzhat\u00f3bb szubsztr\u00e1tokat tesz lehet\u0151v\u00e9. Ezenk\u00edv\u00fcl, <strong>bevonatol\u00e1si technol\u00f3gi\u00e1k<\/strong>-mint p\u00e9ld\u00e1ul t\u00fckr\u00f6z\u0151d\u00e9sg\u00e1tl\u00f3 (AR) vagy v\u00e9d\u0151 v\u00e9konyr\u00e9tegek - tov\u00e1bb b\u0151v\u00edtik a zaf\u00edr szubsztr\u00e1tumok alkalmazhat\u00f3s\u00e1g\u00e1t sz\u00e9ls\u0151s\u00e9ges k\u00f6rnyezetben, bele\u00e9rtve a nagynyom\u00e1s\u00fa optikai m\u00e9r\u00e9stechnik\u00e1t \u00e9s a fejlett l\u00e9zerrendszereket.<\/p>\n\n\n\n<p><strong>K\u00f6vetkeztet\u00e9s<\/strong><br>Optikai min\u0151s\u00e9g\u0171 zaf\u00edr szubsztr\u00e1tumok kombin\u00e1ci\u00f3ja <strong>mechanikai szil\u00e1rds\u00e1g, k\u00e9miai inertit\u00e1s \u00e9s optikai tisztas\u00e1g<\/strong>, ami egyed\u00fcl\u00e1ll\u00f3an alkalmass\u00e1 teszi \u0151ket a nagynyom\u00e1s\u00fa alkalmaz\u00e1sokhoz. Az alapkutat\u00e1st\u00f3l a gy\u00e9m\u00e1nt \u00fcll\u0151cell\u00e1k alkalmaz\u00e1s\u00e1ig \u00e9s az ipari nagynyom\u00e1s\u00fa optikai rendszerekig a zaf\u00edr megb\u00edzhat\u00f3 teljes\u00edtm\u00e9nyt ny\u00fajt ott, ahol m\u00e1s anyagok nem m\u0171k\u00f6dnek. A krist\u00e1lyn\u00f6veszt\u00e9si \u00e9s fel\u00fcletmegmunk\u00e1l\u00e1si technol\u00f3gi\u00e1k folyamatos fejl\u0151d\u00e9s\u00e9vel a zaf\u00edr szubsztr\u00e1tumok v\u00e1rhat\u00f3an egyre fontosabb szerepet j\u00e1tszanak majd a k\u00f6vetkez\u0151 ter\u00fcleteken <strong>\u00faj gener\u00e1ci\u00f3s optika \u00e9s nagynyom\u00e1s\u00fa m\u0171szerek<\/strong>.<\/p>\n\n\n\n<p><strong>GYIK<\/strong><\/p>\n\n\n\n<ol class=\"wp-block-list\">\n<li><strong>Mi\u00e9rt r\u00e9szes\u00fcl el\u0151nyben a zaf\u00edr m\u00e1s optikai anyagokkal szemben a nagynyom\u00e1s\u00fa k\u00eds\u00e9rletekben?<\/strong><br>A zaf\u00edr p\u00e1ratlan kem\u00e9nys\u00e9get, k\u00e9miai inertit\u00e1st \u00e9s sz\u00e9lesk\u00f6r\u0171 optikai \u00e1tl\u00e1tsz\u00f3s\u00e1got \u00f6tv\u00f6z, \u00e9s extr\u00e9m nyom\u00e1s alatt is meg\u0151rzi szerkezeti \u00e9s optikai teljes\u00edtm\u00e9ny\u00e9t.<\/li>\n\n\n\n<li><strong>Haszn\u00e1lhat\u00f3k-e zaf\u00edr szubsztr\u00e1tumok l\u00e1that\u00f3 \u00e9s infrav\u00f6r\u00f6s optik\u00e1khoz egyar\u00e1nt nagy nyom\u00e1s alatt?<\/strong><br>Igen. A zaf\u00edr \u00e1tl\u00e1tsz\u00f3s\u00e1ga az ultraiboly\u00e1t\u00f3l az infrav\u00f6r\u00f6s k\u00f6zep\u00e9ig terjed, lehet\u0151v\u00e9 t\u00e9ve a t\u00f6bb hull\u00e1mhossz\u00fa optikai m\u00e9r\u00e9seket nagynyom\u00e1s\u00fa berendez\u00e9sekben.<\/li>\n\n\n\n<li><strong>Hogyan befoly\u00e1solja a krist\u00e1lyok orient\u00e1ci\u00f3ja a zaf\u00edr szubsztr\u00e1t teljes\u00edtm\u00e9ny\u00e9t?<\/strong><br>Az orient\u00e1ci\u00f3 befoly\u00e1solja a kett\u0151st\u00f6r\u00e9st \u00e9s a mechanikai viselked\u00e9st. P\u00e9ld\u00e1ul a c-s\u00edk\u00fa zaf\u00edrt gyakran haszn\u00e1lj\u00e1k optikai ablakokhoz, mivel az optikai \u00fatvonal ment\u00e9n minim\u00e1lis a kett\u0151st\u00f6r\u00e9se.<\/li>\n<\/ol>","protected":false},"excerpt":{"rendered":"<p>Sapphire (Al\u2082O\u2083) has long been recognized for its exceptional combination of optical clarity, mechanical strength, and chemical stability. Among various forms of sapphire, optical grade sapphire substrates stand out for their purity, defect control, and uniform crystallographic orientation, making them indispensable in advanced optical and high-pressure applications. From aerospace optics to high-pressure scientific experiments, these [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":8014,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_uag_custom_page_level_css":"","footnotes":""},"categories":[27,12],"tags":[1432,1774,1216,1775,1770,1574,1773,1771,1177,1772],"class_list":["post-8617","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-companynews","category-news","tag-chemical-resistance","tag-diamond-anvil-cell","tag-high-pressure-applications","tag-high-pressure-research","tag-high-temperature-optics","tag-laser-optics","tag-optical-grade-sapphire","tag-sapphire-optics","tag-sapphire-substrate","tag-sapphire-windows"],"acf":[],"uagb_featured_image_src":{"full":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp",600,600,false],"thumbnail":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2-150x150.webp",150,150,true],"medium":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2-300x300.webp",300,300,true],"medium_large":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp",600,600,false],"large":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp",600,600,false],"1536x1536":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp",600,600,false],"2048x2048":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp",600,600,false],"trp-custom-language-flag":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp",12,12,false],"woocommerce_thumbnail":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2-300x300.webp",300,300,true],"woocommerce_single":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2.webp",600,600,false],"woocommerce_gallery_thumbnail":["https:\/\/www.sic-wafers.com\/wp-content\/uploads\/2025\/12\/sapphire-windows2-100x100.webp",100,100,true]},"uagb_author_info":{"display_name":"lydia","author_link":"https:\/\/www.sic-wafers.com\/hu\/author\/lydia\/"},"uagb_comment_info":0,"uagb_excerpt":"Sapphire (Al\u2082O\u2083) has long been recognized for its exceptional combination of optical clarity, mechanical strength, and chemical stability. Among various forms of sapphire, optical grade sapphire substrates stand out for their purity, defect control, and uniform crystallographic orientation, making them indispensable in advanced optical and high-pressure applications. From aerospace optics to high-pressure scientific experiments, these&hellip;","_links":{"self":[{"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/posts\/8617","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/comments?post=8617"}],"version-history":[{"count":1,"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/posts\/8617\/revisions"}],"predecessor-version":[{"id":8618,"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/posts\/8617\/revisions\/8618"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/media\/8014"}],"wp:attachment":[{"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/media?parent=8617"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/categories?post=8617"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.sic-wafers.com\/hu\/wp-json\/wp\/v2\/tags?post=8617"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}